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AS1123
Datasheet - A p p l i c a t i o n I n f o r m a t i o n
The last pattern written into the shift register will be saved before starting low-current diagnosis mode and can be displayed immediately after the
test has been performed.
Low-current diagnostic mode is started with 3 clock pulses during error detection mode. Then OEN should be enabled for ≥ 2 s for testing. With
the rising edge of OEN the LED test is stopped, and while LD is high the desired error mode can be selected with the corresponding clock
pulses. After LD and OEN go low again the previously saved pattern can be displayed at the outputs.
With the next data input the detailed error code will be clocked out at pin SDO.
Note: See Figure 21 for use of an external test pattern.
Figure 21. Low-Current Diagnosis Mode with External Test Pattern – 64 Cascaded AS1123s
Low-Current Diagnosis Mode
Display
Data1
Data2
SDI
External all 1s Test Pattern
Data2
Data3
SDO
T/O or S Error Code
Data0
3x Clocks
GEF
O or S Error Code
from Test Pattern
GEF
Temperature Error Code
Low-Current
Mode
Clock for Error
Mode 1x/2x
CLK
OEN
LD
Current
1024x
≤ 40mA
1024x
Rising Edge of OEN
Acquisition of Error Status
Falling Edge LD; Error Regis-
ter is copied into Shift Register
≤ 40mA
1024x
≤ 0.8mA
GEF = Global Error Flag
Cascading Devices
To cascade multiple AS1123 devices, pin SDO must be connected to pin SDI of the next AS1123 (see Figure 22) . At each rising edge of CLK the
LSB of the shift register will be written into the shift register SDI of the next AS1123 in the chain.
Note: When n *AS1123 devices are in one chain, n *16 clock pulses are needed to latch-in the input data.
Figure 22. Cascading AS1123 Devices
SDI
SDI
AS1123 #1
SDO SDI
AS1123 #2
SDO
SDI
AS1123 # n -1
SDO
CLK
LD
OEN
CLK
LD
OEN
CLK
LD
OEN
CLK
LD
OEN
www.austriamicrosystems.com/LED-Driver-ICs
Revision 1.00
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